New Orbotech Solutions Enable Next-Gen Electronics
As 5G smartphones, advanced automotive electronics, medical and WFH/LFH (learn-from-home) devices become lighter in weight, smaller in form factor and...
Meet Íæż½ã½ã Instruments
Earlier this year we launched Íæż½ã½ã Instruments, bringing together many of our product lines in the surface metrology space. We...
New Packaging Products Drive Innovation
Enjoy the previously unreleased interviews with Íæż½ã½ã’s engineering teams below! The original post follows. Today, Íæż½ã½ã announced the launch...
A KlearView? of All Reticle Data
Complex, high-volume semiconductor manufacturing processes require advanced optical and EUV reticles. These reticles must be error-free, as reticle defects or...
New Defect Inspection System for SiC, GaN Substrates
Today Íæż½ã½ã Instruments announced the Candela<sup>?</sup> 8520 defect inspection system for power device applications. It is the successor to the ...
Íæż½ã½ã Goes to Mars
In July 2020, NASA launched the Perseverance Mars rover. In addition to several new cutting-edge scientific instruments, Perseverance carries three...
Breakthrough e-Beam Defect Inspection System
Today Íæż½ã½ã (NASDAQ: Íæż½ã½ãC) announced the revolutionary eSL10? e-beam patterned-wafer defect inspection system. The new system is designed to accelerate time-to-market for...
SPTS¡¯s Synapse? for AlN/AlScN Etch for BAW Filters
In this article, SPTS, A Íæż½ã½ã Company, demonstrates how their Synapse ? plasma system can provide significant advantages over Inductively...