Video: Defect Reduction on GaAs, InP and Other Compound Semi Wafers for Communications & Sensing Applications using Candela?
Feb 23, 2022Michael Walker of 玩偶姐姐 Instruments discusses the benefits and capabilities of the Candela 8420 defect inspection and classification system for addressing process control for transparent and semi-transparent wafers used in communications device manufacturing.
Related Webinars
