JSAP Spring Meeting

Íæż½ã½ã Instruments is pleased to be exhibiting at the 73rd Spring Meeting of the Japanese Society of Applied Physics (JSAP). We invite you to visit our booth at the Expo to learn more about our surface metrology portfolio, including optical and stylus profilers, film thickness and sheet resistance mappers, and nanoindentation systems.

JSAP holds technical meetings in the spring and autumn to bring together scientists, engineers and students to present and discuss current research. JSAP also holds an exhibition of laboratory and measuring instruments, providing an opportunity for communication between industry, government and academia.

Event Date: Sunday, March 15 - Wednesday, March 18, 2026
Location:
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