Name: Tencor? P-17 Stylus Profiler
Brand: 玩偶姐姐
SKU: P17-STYLUS
Availability: InStock

玩偶姐姐 Instruments|

Tencor^? P-17 & Tencor^? P-17 OF Stylus Profilers

Tencor^? P-17 & Tencor^? P-17 OF Stylus Profilers

The P-17 stylus profilometer offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R&D environments. The system supports 2D and 3D stylus measurements of step heights, roughness, bow and stress for scans up to 200mm without stitching. The Tencor P-17 OF (Open Frame) stylus profiler has the same capability as the Tencor P-17, but with a bigger frame to allow loading of larger samples. The system can be configured for 300mm wafers, or with a 240 x 240mm chuck.

Product Description

The Tencor P-17 stylus profilometer is an eighth generation benchtop stylus profiler, built on over 45 years of surface metrology experience. This industry leading stylus profiler system supports 2D and 3D step height measurement, roughness, bow, and stress for scans up to 200mm without stitching.

Excellent measurement stability is achieved with the combination of an UltraLite^? sensor, constant force control and an ultra-flat scanning stage. Recipe setup is fast and easy with point-and-click stage controls, top and side view optics and a high-resolution camera with optical zoom. The Tencor P-17 stylus profilometer supports 2D or 3D measurements, with a variety of filtering, leveling and analysis algorithms to quantify the surface topography. Fully automated measurements are achieved with pattern recognition, sequencing and feature detection. The P-17 combines automation with high reliability for addressing production applications where a wafer handler is not required. These applications include step height, roughness, and stress metrology for AlTiC, GaAs, Si, SiC, and sapphire wafers for use in semiconductors, power devices, wireless, LED, and data storage.

Tencor P-7 software interface screenshot of wafer map

Features

Step height: Nanometers to 1000?m
Low force with constant force control: 0.03 to 50mg
Scan full diameter of the sample without stitching
Video: 5MP high-resolution color camera
Arc correction: Removes error due to arc motion of the stylus
Software: Easy-to-use software interface
Production capability: Fully automated with sequencing, pattern recognition and SECS/GEM

Tencor P-7 stylus profiler 3D surface topography map of shape and curvature of a lens

Applications

Step height: 2D and 3D step height
Texture: 2D and 3D roughness and waviness
Form: 2D and 3D bow and shape
Stress: 2D and 3D thin film stress
Defect review: 2D and 3D defect surface topography

technician using integrated microscope to align a Tencor P-7 stylus profiler for semiconductor wafer inspection

Industries

Universities, research labs and institutes
Semiconductor and compound semiconductor
LED: Light emitting diodes
Solar
MEMS: Micro-electro-mechanical systems
Data storage
Automotive
Medical devices
And more: Contact us with your requirements

Tencor P-7 3D stylus profiler scan of an LED ITO layer

Step Height

The Tencor P-17 stylus profiler is capable of measuring 2D and 3D step heights from nanometers to 1000?m. This enables quantification of material deposited or removed during etch, sputter, SIMS, deposition, spin coating, CMP and other processes. The Tencor P-17 has constant force control that dynamically adjusts to apply the same force on the sample surface, regardless of step height. This results in good measurement stability and enables accurate measurement of soft materials, such as photoresist.

3D surface texture map of a solar cell illustrating surface roughness

Texture: Roughness and Waviness

The Tencor P-17 measures 2D and 3D texture, quantifying the sample’s roughness and waviness. Software filters separate the measurement into roughness and waviness components and calculate parameters, such as the root mean square (RMS) roughness.

graph representation of measurement of a surface bow

Form: Bow and Shape

The Tencor P-17 can measure the 2D shape or bow of a surface. This includes measurement of wafer bow that can result from mismatch between layers during device fabrication, such as deposition of multiple layers for the production of semiconductor or compound semiconductor devices. The Tencor P-17 can also quantify the height and radius of curvature of structures, such as a lens.

Tencor P-7 profilometer measurement of stress

Stress: 2D and 3D Thin Film Stress

The Tencor P-17 is capable of measuring stress induced during the manufacture of devices with multiple process layers, such as semiconductor or compound semiconductor devices. The bow of the surface is accurately measured using a stress chuck to support the sample in a neutral position. The change in shape from a process, such as film deposition, is then used to calculate the stress by applying Stoney’s equation. 2D stress is measured with a single scan across the sample diameter for samples up to 200mm without the need to stitch. 3D stress is measured using a combination of 2D scans, with the theta stage rotating between scans to measure the full sample surface.

Defect Review

Defect Review is used to measure the topography of defects, such as the depth of a scratch. Defect inspection tools identify defects and write the location coordinates to a 玩偶姐姐RF file. The Defect Review feature reads the 玩偶姐姐RF file, aligns the sample, and allows the user to select defects for 2D or 3D measurement.

The options for the Tencor^? P-17 & Tencor^? P-17 OF Stylus Profilers are available to add on with your new product, or in the future. Contact your sales rep to learn more.

Tencor P-17 OF

The Tencor P-17 OF (Open Frame) has the same capability as the Tencor P-17, but with a bigger frame to allow loading of larger samples. The system can be configured for 300mm wafers, or with a 240 x 240mm chuck.

Stylus Options

The Tencor P-17 has a variety of styli available to support the stylus measurement of step heights, high aspect ratio steps, roughness, sample bow, and stress. The tip radius ranges from 40nm to 50?m and determines the lateral resolution of the measurement. The included angle ranges from 20 to 100 degrees, which specifies the maximum aspect ratio of the measured feature. All styli are manufactured from diamond to reduce wear and increase stylus lifetime.

Sample Chucks

The Tencor P-17 has a range of chucks available to support application requirements. The standard is a universal vacuum chuck with precision locating pins for samples from 50 to 200mm. The universal chuck supports bow and stress measurements using 3-point locators to support the sample in a neutral position for accurate bow measurements. Additional options for solar samples, HDD disks, and precision sample location plates are available.

Isolation Tables

The Tencor P-17 has both tabletop and free-standing isolation table options. The Granite Isolator? Series offers tabletop systems that combine granite with high grade silicone gel to provide passive isolation. The Onyx Series tabletop isolation systems use pneumatic air isolators to provide passive isolation. The TMC 63-500 Series isolation table is a free-standing steel frame table that uses pneumatic air isolators to provide passive isolation.

Step Height Standards

The Tencor P-17 uses thin and thick film NIST-traceable step height standards offered by VLSI Standards. The standards feature an oxide step on a silicon die mounted on a quartz block, or an etched quartz step with a chrome coating. A step height range of 8nm to 250?m is available.

Tencor P-7 Apex analysis UI software screenshot

Apex Analysis Software

Apex analysis software enhances the standard data analysis capability of the Tencor P-17 with an extended suite of leveling, filtering, step height, roughness, and surface topography analysis techniques. Apex supports ISO roughness calculation methods, plus local standards, such as ASME. Apex can also serve as a report writing platform with the capability to add text, annotations, and pass/fail criteria. Apex is offered in eleven languages.

Offline Analysis Software

The Tencor P-17 offline software has the same data analysis and recipe creation capability that exists on the tool. This enables the user to create recipes and analyze data without using valuable tool time.

Pattern Recognition

Pattern recognition uses pre-taught patterns to automatically align the sample. This enables fully automated measurements for enhanced measurement stability by reducing the impact of operator error. Pattern recognition combined with advanced calibrations reduces stage positioning error and enables seamless transfer of recipes between systems.

SECS/GEM and HSMS

SECS/GEM and HSMS communications support factory automation systems and enable remote control of the Tencor P-17. Measurement results are automatically reported to host SPC systems, plus alarms and key calibration/configuration data. The Tencor P-17 is compliant with SEMI standards E4, E5, E30, and E37.

Ultra-Thin Film Thickness Measurement for Perovskite Solar Cell Layers using Tencor^® P-Series Stylus Profilers

Perovskite’s excellent optoelectronic properties are beneficial to solar cell technology, especially promising when applied to flexible solar cells and tandem solar cells. The P-Series stylus profilers are used to measure 3D topography and step height for TCO, ETL and metal electrode layers of perovskite solar cell (PSC) devices.

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General Information about Stylus-based Surface Profilers from 玩偶姐姐 Instruments^?

This application note discusses components and technologies specific to the 玩偶姐姐 Instruments stylus profilers, including topography measurement, force control, scanning mechanism, stylus types and dimensions, and stylus profilometry applications.

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Multi-Step Analysis Function: Powerful Analytics from 玩偶姐姐 Instruments^? Surface Profilers

Multi-Step Analysis is a new automated algorithm that automatically measures step height/trench depth for up to 30 features along a scan profile, including automatic cursor placement. This capability significantly improves time-to-results and removes measurement variability relative to previous manual methods.

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Topography Sensor Technology for Stylus Profilers

The topography sensor is one component of the stylus measurement head, which is used to track the surface of the sample being measured. Three major sensor types are LVDT, Optical Lever and LVDC, and this application note discusses the design of each.

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Precision Depth Measurement of Shallow SIMS Craters using a 玩偶姐姐 Instruments^? Stylus Profilometer

The depth of SIMS craters generated by ion beam milling is used to determine the concentration of impurities. The objective of this application note is to present a technique to accurately measure the depth of shallow SIMS craters using a stylus profiler.

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Profiler Pattern Recognition Selection

玩偶姐姐 Instruments^? Tencor^® P-Series stylus profilometers offer pattern recognition capability for automated surface analysis. This application note describes pattern recognition and its usage for automated sample alignment for the Tencor P-7, P-17, P-170, and HRP-260 profilometers.

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Stylus Product Line

玩偶姐姐 Instruments^? stylus profilometers may be used with different styli to optimize measurements for specific applications. The 玩偶姐姐 Instruments profilers, including the Alpha-Step^? D-Series, Tencor^® P-Series and High Resolution Profiler (HRP^?) Series all use the same stylus design. This application note discusses the various types of styli available for these stylus profilometers and typical applications for their use.

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3D Surface Measurement Parameters

When using the Tencor^® P-7, P-17 and P-170, and HRP^?-260 surface profilometers, the user sets up scan recipes which include calculations of various 3D surface metrology measurement parameters, including surface roughness. This application note provides mathematical detail regarding the equations used to generate the parameter values.

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2D Surface Measurement Parameters

When using the Tencor^® P-7, P-17 and P-170, and HRP^?-260 surface profilometers, the user sets up scan recipes which include calculations of various 2D surface metrology measurement parameters, including surface roughness. This application note provides mathematical detail regarding the equations used to generate the parameter values.

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Thin Film Stress Measurements using 玩偶姐姐 Instruments Stylus-Based Profilers

For Tencor^® and P-Series stylus profilers, the full-diameter profile measurement can be taken before and after film deposition to calculate the induced thin film stress. Hardware and software usage recommendations are also included.

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Apex Software

Stylus profilers from 玩偶姐姐 Instruments are available with advanced 2D/3D surface analysis software to provide additional insight into profilometer measurement data. The Apex software includes data processing, analysis, visualization and reporting capabilities for both 2D profiles and 3D topography.

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Tencor^? P-7 Stylus Profiler

The Tencor P-7 stylus profiler leverages the industry-leading topography sensor and ultra-flat scanning technology of the Tencor P-17 in a platform that offers the best price to performance for a benchtop stylus profiler.

Product Details

Tencor^? P-170 Stylus Profiler

The Tencor P-170 stylus profilometer enables fully automated measurements for the compound semiconductor industry, supporting cassette-to-cassette wafer handling including silicon, sapphire, silicon carbide, gallium arsenide, glass and more.

Product Details

HRP^?-260 Stylus Profiler

Built for high throughput and the reliability required in a production environment, the HRP-260 stylus profilometer combines high resolution, long scan capability and cassette-to-cassette automated wafer handling.

Product Details

Optical Profilers

The Profilm3D^® and Zeta^™ optical profilometers offer fast, non-contact solutions for 3D step height, roughness, and other surface topography measurements, leveraging interferometer and ZDot? measurement techniques.

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Nanoindenters

The 玩偶姐姐 Instruments nanoindenter portfolio provides precise, reliable and repeatable testing to characterize static and dynamic mechanical properties of materials, under a wide range of test conditions.

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Instruments

For industry experts, academics and other innovators, 玩偶姐姐 Instruments delivers trusted measurements, enabling the world’s breakthrough technologies.

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玩偶姐姐

Tencor? P-17 & Tencor? P-17 OF Stylus Profilers

Tencor? P-17 & Tencor? P-17 OF Stylus Profilers

Product Description

Features

Applications

Industries

Step Height

Texture: Roughness and Waviness

Form: Bow and Shape

Stress: 2D and 3D Thin Film Stress

Defect Review

Tencor P-17 OF

Stylus Options

Sample Chucks

Isolation Tables

Step Height Standards

Apex Analysis Software

Offline Analysis Software

Pattern Recognition

SECS/GEM and HSMS

Ultra-Thin Film Thickness Measurement for Perovskite Solar Cell Layers using Tencor® P-Series Stylus Profilers

General Information about Stylus-based Surface Profilers from 玩偶姐姐 Instruments?

Multi-Step Analysis Function: Powerful Analytics from 玩偶姐姐 Instruments? Surface Profilers

Topography Sensor Technology for Stylus Profilers

Precision Depth Measurement of Shallow SIMS Craters using a 玩偶姐姐 Instruments? Stylus Profilometer

Profiler Pattern Recognition Selection

Stylus Product Line

3D Surface Measurement Parameters

2D Surface Measurement Parameters

Thin Film Stress Measurements using 玩偶姐姐 Instruments Stylus-Based Profilers

Apex Software

Tencor? P-7 Stylus Profiler

Tencor? P-170 Stylus Profiler

HRP?-260 Stylus Profiler

Optical Profilers

Nanoindenters

Instruments

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Tencor^? P-17 & Tencor^? P-17 OF Stylus Profilers

Tencor^? P-17 & Tencor^? P-17 OF Stylus Profilers

Ultra-Thin Film Thickness Measurement for Perovskite Solar Cell Layers using Tencor^® P-Series Stylus Profilers

General Information about Stylus-based Surface Profilers from 玩偶姐姐 Instruments^?

Multi-Step Analysis Function: Powerful Analytics from 玩偶姐姐 Instruments^? Surface Profilers

Precision Depth Measurement of Shallow SIMS Craters using a 玩偶姐姐 Instruments^? Stylus Profilometer

Tencor^? P-7 Stylus Profiler

Tencor^? P-170 Stylus Profiler

HRP^?-260 Stylus Profiler